The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Mar. 28, 2011
James E. Engel, Newport Beach, CA (US);
Rodney Stephen Wright, Huntington Beach, CA (US);
Chin Hoi Toh, Orange, CA (US);
William Talion Edwards, Foristell, MO (US);
James E. Engel, Newport Beach, CA (US);
Rodney Stephen Wright, Huntington Beach, CA (US);
Chin Hoi Toh, Orange, CA (US);
William Talion Edwards, Foristell, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structure which is intended to impart a movement of the structure or a movement of objects within the structure, obtaining a secondary scan of the structure, the secondary scan obtained from a same position, with respect to the structure, as the baseline scan, determining any differences between the baseline scan and the secondary scan, and identifying at least one of a foreign object proximate the structure and a structural anomaly associated with the structure based on any differences between the baseline scan and the secondary scan.