The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Jun. 07, 2010
Applicants:

Takeshi Yasuie, Kawasaki, JP;

Yuji Nomura, Kawasaki, JP;

Tetsuya Nishi, Kawasaki, JP;

Shunsuke Kikuchi, Kawasaki, JP;

Taichi Sugiyama, Kawasaki, JP;

Inventors:

Takeshi Yasuie, Kawasaki, JP;

Yuji Nomura, Kawasaki, JP;

Tetsuya Nishi, Kawasaki, JP;

Shunsuke Kikuchi, Kawasaki, JP;

Taichi Sugiyama, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality locating apparatus locates an abnormal location in a network. An abnormal location judging part judges a normality or abnormality of a link based on a normality or abnormality of an observation flow, by acquiring information of links through which each observation flow passes, from a network route information storage that stores passing route information of observation flows passing through the links. A diagnosis accuracy judging part judges that an accuracy of judging the normality or abnormality of a connecting link connected to a first node deteriorates, by acquiring links connected to each relay node as connecting links from a relay node connecting link information storage that stores connecting link information of each relay node, and judging that a relay node having all connecting links thereof that are abnormal is the first node having all observation flows passing therethrough that are abnormal.


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