The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Nov. 18, 2010
Applicants:

Tatsuo Nakata, Tokyo, JP;

Kosuke Takagi, Saitama, JP;

Inventors:

Tatsuo Nakata, Tokyo, JP;

Kosuke Takagi, Saitama, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser scanning microscope includes a stage that moves a sample placed thereon, a laser light source that emits laser light, a line-focus optical system that focuses the laser light into a line shape, a DMD including a plurality of movable micromirrors that are arrayed in the lengthwise direction of the line shape and that reflect the line-focused laser light, an irradiation optical system that irradiates the sample with the laser light reflected by the DMD, and a photodetector in which a plurality of channels for detecting light from the sample are arrayed in one column, wherein the DMD is driven so that a plurality of micromirrors simultaneously reflect the laser light and so that micromirrors that reflect the laser light are sequentially switched, wherein the stage moves the sample in a direction crossing the array direction of a plurality of light spots formed on the sample.


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