The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Mar. 30, 2011
Wen-yuh Jywe, Huwei Township, Yulin County, TW;
Chia-hung Wu, Taixi Township, Yunlin County, TW;
I-ching Chen, Huwei Township, Yunlin County, TW;
Tung-hui Hsu, Kaohsiung, TW;
Ren-chieh Fung, Taichung, TW;
Teng-yu Yang, Taichung, TW;
Wen-Yuh Jywe, Huwei Township, Yulin County, TW;
Chia-Hung Wu, Taixi Township, Yunlin County, TW;
I-Ching Chen, Huwei Township, Yunlin County, TW;
Tung-Hui Hsu, Kaohsiung, TW;
Ren-Chieh Fung, Taichung, TW;
Teng-Yu Yang, Taichung, TW;
National Formosa University, Yunlin County, TW;
Abstract
An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile