The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Nov. 03, 2010
Martin Hardegger, Sargans, CH;
Reto Berner, Aarau, CH;
Richard Galera, Nashua, NH (US);
Suresh Nair, Amherst, NH (US);
Carl Meinherz, Malans, CH;
Craig Martin Brockman, Windham, NH (US);
Elik I. Fooks, Lexington, MA (US);
Manfred Norbert Stein, Graubuenden, CH;
Robert M. Black, Bolton, MA (US);
Martin Hardegger, Sargans, CH;
Reto Berner, Aarau, CH;
Richard Galera, Nashua, NH (US);
Suresh Nair, Amherst, NH (US);
Carl Meinherz, Malans, CH;
Craig Martin Brockman, Windham, NH (US);
Elik I. Fooks, Lexington, MA (US);
Manfred Norbert Stein, Graubuenden, CH;
Robert M. Black, Bolton, MA (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
A system for calibrating a color sensing pixel based upon the distance between the color sensing pixel and an object. The distance is determined by measuring the phase shift of electromagnetic radiation as reflected from the surface of the object compared with the wave profile of the electromagnetic radiation incident on the object surface. The color sensing pixel is associated with a Time-of-Flight (ToF) pixel which is employed to determine the distance of the color sensing pixel. The electromagnetic radiation can be from any part of the electromagnetic spectrum, in particular the infrared and visible light portions of the electromagnetic spectrum. The color sensing pixel and the ToF pixel can reside on the same semiconductor or on disparate semiconductors.