The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Mar. 27, 2009
Applicants:

Tetsujiro Kondo, Tokyo, JP;

Tetsushi Kokubo, Kanagawa, JP;

Kenji Tanaka, Kanagawa, JP;

Hitoshi Mukai, Kanagawa, JP;

Hirofumi Hibi, Kanagawa, JP;

Kazumasa Tanaka, Chiba, JP;

Takuro Ema, Tokyo, JP;

Hiroyuki Morisaki, Tokyo, JP;

Inventors:

Tetsujiro Kondo, Tokyo, JP;

Tetsushi Kokubo, Kanagawa, JP;

Kenji Tanaka, Kanagawa, JP;

Hitoshi Mukai, Kanagawa, JP;

Hirofumi Hibi, Kanagawa, JP;

Kazumasa Tanaka, Chiba, JP;

Takuro Ema, Tokyo, JP;

Hiroyuki Morisaki, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus includes: an amount-of-feature detection section configured to determine an amount of features of a first image and an amount of features of a second image, the first image and the second image containing the same subject; an elimination-area detection section configured to eliminate, from the second image, an area in which the amount of features extracted by the amount-of-feature detection section is larger than a predetermined threshold and to provide the second image in which the eliminated area is transparent; and an image combination section configured to superimpose the second image in which the eliminated area is transparent on the first image.


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