The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Apr. 05, 2011
Applicant:

Hirokazu Yanai, Osaka, JP;

Inventor:

Hirokazu Yanai, Osaka, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G01B 5/26 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A disclosed identification method of identifying a data point distribution area on a coordinate plane includes selecting a data point as a first representative point, setting the first representative point as an initial reference point, setting a direction passing through the initial reference point as an initial representative point selection direction, selecting an initial data point direction having a smallest angle relative to the initial representative point selection direction in a predetermined rotation direction when viewed from the initial representative point selection direction, selecting a data point corresponding to the initial data point direction as a second representative point of the data point distribution area, and determining whether there is an overlapping area where a distribution representative point area overlaps a determination area.


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