The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Jan. 30, 2004
Applicants:

Stewart R. Carl, Palo Alto, CA (US);

Michael J. Mandella, Palo Alto, CA (US);

Guanghua G. Zhang, San Jose, CA (US);

Hector H. Gonzalez-banos, Mountain View, CA (US);

Inventors:

Stewart R. Carl, Palo Alto, CA (US);

Michael J. Mandella, Palo Alto, CA (US);

Guanghua G. Zhang, San Jose, CA (US);

Hector H. Gonzalez-Banos, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/033 (2013.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for processing pose data derived from a pose of an elongate object such as, for example, a jotting implement, a pointer, a robotic arm or a cane. The elongate object has a tip contacting a plane surface with one or more invariant features. The pose of the elongate object is measured optically from on-board by an optical measuring system with the aid of the invariant feature. The pose is used for preparing a corresponding pose data and a subset of the pose data is identified and transmitted to an application such as a user application, where the subset can serve as command data or input data. Since the elongate object moves while its tip is contacting the surface the pose is measured periodically at sufficiently frequent measurement times tto describe the motion at a desired temporal resolution. The subset can include all or a portion of the orientation data that describe the orientation of the elongate object in space and/or position data of the tip on the surface. The position can be a relative position of the tip with respect to any feature or its previous position, or an absolute position in world coordinates. The subset can also contain a mix of orientation and position data.


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