The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Apr. 19, 2011
Jerry Hanauer, Germantown, WI (US);
Todd O'connor, Menomonee Falls, WI (US);
Jerry Hanauer, Germantown, WI (US);
Todd O'Connor, Menomonee Falls, WI (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
Systems and methods for determining multiple touch events in a multi-touch sensor system are provided. The system may include a capacitance measurement unit, a pulse drive unit, and a touch sensor having a plurality of nodes and a plurality of electrodes comprising at least two sets of electrodes. The method may include connecting a first electrode in a first set to the capacitance measurement unit, the pulse drive unit driving a voltage or current pulse onto a second electrode in a second set of electrodes. The method may further include the capacitance measurement unit measuring the mutual capacitance at a node corresponding to the first and second electrodes. The method may include comparing the measured mutual capacitance at the node with a previously measured mutual capacitance for the node, and reporting that the node has been touched if there has been a deviation from the previously measured mutual capacitance.