The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Mar. 17, 2009
Kenya Ishii, Suwa, JP;
Kenya Ishii, Suwa, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
An inspection circuit for inspecting an electro-optic device that includes a data line, a scanning line, a pixel portion, a driving circuit, and a first terminal portion through which a first power supply voltage is supplied to the driving circuit. The inspection circuit includes an inspection line electrically connected to an inspection unit inspecting the pixel portion, a connection circuit electrically connecting the inspection line to the data line, and a supply circuit supplying a control signal for controlling conduction between the data line and the inspection line to the connection circuit. The supply circuit is driven using a second power supply voltage supplied through a second terminal portion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile