The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Aug. 10, 2010
Applicants:
Takahiko Kakemizu, Tokyo, JP;
Akihiro Fujii, Tokyo, JP;
Inventors:
Takahiko Kakemizu, Tokyo, JP;
Akihiro Fujii, Tokyo, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01B 3/30 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 5/28 (2013.01); G01B 3/30 (2013.01); G01B 21/042 (2013.01);
Abstract
A material measure for use in evaluating the performance of a measuring instrument for measuring surface texture includes: a measurement area having a plurality of grooves in a predetermined direction. With the configuration, each of the grooves has a simple cross-sectional shape at a cross-section along the predetermined direction; and a length of the cross-sectional shape in the predetermined direction is different for the predetermined number of adjacent grooves in the predetermined direction.