The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8539585 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 17, 2013

Filed:

Jun. 25, 2007
Applicants:

Shuo Chen, Kenmore, WA (US);

Ralf Sasse, Urbana, IL (US);

Jiahe Helen Wang, Issaquah, WA (US);

Yi-min Wang, Bellevue, WA (US);

Inventors:

Shuo Chen, Kenmore, WA (US);

Ralf Sasse, Urbana, IL (US);

Jiahe Helen Wang, Issaquah, WA (US);

Yi-Min Wang, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To achieve end-to-end security, traditional machine-to-machine security measures are insufficient if the integrity of the graphical user interface (GUI) is compromised. GUI logic flaws are a category of software vulnerabilities that result from logic flaws in GUI implementation. The invention described here is a technology for uncovering these flaws using a systematic reasoning approach. Major steps in the technology include: (1) mapping a visual invariant to a program invariant; (2) formally modeling the program logic, the user actions and the execution context, and systematically exploring the possibilities of violations of the program invariant; (3) finding real spoofing attacks based on the exploration.


Find Patent Forward Citations

Chen, Shuo. (2013). Systematic approach to uncover visual ambiguity vulnerabilities (U.S. Patent No. 8539585). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8539585

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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