The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Apr. 14, 2008
Applicants:

Eun Young Kim, Daejeon, KR;

Young Tae Yun, Daejeon, KR;

Eung Ki Park, Daejeon, KR;

Inventors:

Eun Young Kim, Daejeon, KR;

Young Tae Yun, Daejeon, KR;

Eung Ki Park, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a device and method for inspecting software for vulnerabilities which fuzzes the software by function. The device for inspecting software for vulnerabilities includes a target function selecting module for selecting a function of the software for vulnerabilities to be inspected, a comparison file generating module for generating a first file including the selected function and a second file not including the selected function, a binary pattern comparing module for detecting a changed or added binary pattern by comparing binary values of the first file and the second file, a test case generating module for generating at least one test case based on the detected binary pattern, and a vulnerability verifying module for inspecting vulnerabilities based on the at least one test case and generating a vulnerability inspection result. Accordingly, by intensively fuzzing a part of the software which is changed or added according to the function of the software, software vulnerabilities can be found by each function and fuzzing efficiency can be improved.


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