The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Sep. 11, 2009
Applicants:

Kathryn A. Bassin, Endicott, NY (US);

Sheng Huang, Shanghai, CN;

Steven Kagan, Oakbrook Terrace, IL (US);

Shao C. LI, Beijing, CN;

Zhong J. LI, Beijing, CN;

He H. Liu, Beijing, CN;

Susan E. Skrabanek, Atlanta, GA (US);

Hua F. Tan, Beijing, CN;

Jun Zhu, Shanghai, CN;

Inventors:

Kathryn A. Bassin, Endicott, NY (US);

Sheng Huang, Shanghai, CN;

Steven Kagan, Oakbrook Terrace, IL (US);

Shao C. Li, Beijing, CN;

Zhong J. Li, Beijing, CN;

He H. Liu, Beijing, CN;

Susan E. Skrabanek, Atlanta, GA (US);

Hua F. Tan, Beijing, CN;

Jun Zhu, Shanghai, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes creating a macro plan for a test project, creating a micro plan for the test project, wherein the micro plan and the macro plan are based on at least one common parameter, and reconciling the macro plan and the micro plan by identifying deviations between the macro plan and the micro plan based on the at least one common parameter.


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