The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Aug. 09, 2006
André K. Nieuwland, Waarle, NL;
Sandeepkumar Goel, Eindhoven, NL;
Erik J. Marinissen, Eindhoven, NL;
Hubertus G. H. Vermeulen, Eindhoven, NL;
Hendrikus P. E. Vranken, Weert, NL;
André K. Nieuwland, Waarle, NL;
Sandeepkumar Goel, Eindhoven, NL;
Erik J. Marinissen, Eindhoven, NL;
Hubertus G. H. Vermeulen, Eindhoven, NL;
Hendrikus P. E. Vranken, Weert, NL;
NXP B.V., Eindhoven, NL;
Abstract
An integrated circuit comprises a scan chain with parallel inputs and outputs coupled to a functional circuit. A scan chain modifying circuit is provided coupled to the scan chain. When testing is authorized the scan chain modifying circuit operates in a mode wherein a normal shift path is provided through the scan chain. When testing is not authorized the scan chain modifying circuit operates to effect spontaneous dynamic changes in the shift path, which dynamically vary the length of the shift path between external terminals of the integrated circuit while shifting takes place. In an embodiment the dynamical variations are controlled by a running key comparison. In other embodiments running key comparison is used to disable transfer through the scan chain or operation of functional circuits.