The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Dec. 22, 2010
Applicants:
Xiangping Chen, Shrewsbury, MA (US);
Miles A. DE Forest, Bahanma, NC (US);
Joseph B. Shimkus, Framingham, MA (US);
Philippe Armangau, Acton, MA (US);
Mark Ku, Wollaston, MA (US);
Inventors:
Xiangping Chen, Shrewsbury, MA (US);
Miles A. de Forest, Bahanma, NC (US);
Joseph B. Shimkus, Framingham, MA (US);
Philippe Armangau, Acton, MA (US);
Mark Ku, Wollaston, MA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is used in improving deduplication efficiency. Metadata of a data object is evaluated for determining write activity of the data object. Based on the write activity, deduplicating technique is applied to the data object.