The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Oct. 14, 2009
Applicants:

Dinesh Kumar, Hawthorne, NY (US);

Asser N. Tantawi, Hawthorne, NY (US);

LI Zhang, Hawthorne, NY (US);

Inventors:

Dinesh Kumar, Hawthorne, NY (US);

Asser N. Tantawi, Hawthorne, NY (US);

Li Zhang, Hawthorne, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 9/50 (2006.01); G06F 15/173 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for determining a real-time performance model of systems that process multi-class workloads. The methods can include collecting measurement data, selecting a series of prior time windows, processing the measurement data to compute a set of constraints based on the measurement data from the series of prior time windows, augmenting the set of constraints to a measurement model to obtain an augmented measurement model and running a modified extended Kalman filter with the augmented measurement model to obtain a state estimate.


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