The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Jul. 28, 2010
Applicants:

Takashi Bandou, Nagoya, JP;

Naoki Fukaya, Oobu, JP;

Inventors:

Takashi Bandou, Nagoya, JP;

Naoki Fukaya, Oobu, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an apparatus, an applying unit applies selected classifiers in sequence to an object image. A score calculating unit calculates, each time a classifier is applied to the object image, a summation of an output of an at least one classifier already applied to the object image to thereby obtain an acquisition score as the summation. The output of the at least one already applied classifier is weighed by a corresponding weight. A distribution calculating unit calculates, each time a classifier is applied to the object image, a predicted distribution of the acquisition score that would be obtained if at least one unapplied classifier in the classifiers, which has not yet been applied to the object image, were applied to the object image. A judging unit judges, based on the predicted distribution, whether to terminate an application of the at least one unapplied classifier to the object image.


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