The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Jun. 22, 2009
Hany Farid, White River Junction, VT (US);
LI Hong, San Diego, CA (US);
Hany Farid, White River Junction, VT (US);
Li Hong, San Diego, CA (US);
Nikon Corporation, Tokyo, JP;
Abstract
The present invention is directed to a method for detecting or predicting () whether a test image is blurred. In one embodiment, the method includes extracting a training statistical signature () that is based on a plurality of data features () from a training image set (), the training image set () including a sharp image () and a blurry image (); training a classifier () to discriminate between the sharp image () and the blurry image () based on the training statistical signature; and applying () the trained classifier to a test image that is not included in the training image set () to predict whether the test image is sharp () or blurry (). The step of extracting can include measuring one or more statistical moments () for various levels (L-L), estimating a covariance () between adjacent levels (L-L), and/or extracting various metadata features () from the images (). The step of training () can include training a non-linear support vector machine () or a linear discriminant analysis () on the training statistical signature of the training image set ().