The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Aug. 27, 2010
Shinji Yamakawa, Kanagawa, JP;
Shinji Yamakawa, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
An image inspection apparatus that compares a reference image with an inspection image obtained by scanning a printed medium on which the reference image has been printed, to determine whether the printed medium is acceptable is provided. The image inspection apparatus includes a first inspecting unit that compares the reference image exclusive of an edge in the reference image with the inspection image exclusive of an edge in the inspection image to perform inspection; a line-image detecting unit that detects a line image that contains the edge from each of the reference image and the inspection image; a second inspecting unit that compares the line image detected from the reference image with the line image detected from the inspection image to perform inspection; and a determining unit that determines whether the printed medium is acceptable based on results of these inspections.