The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Jul. 27, 2011
Applicants:

Tsukasa Endo, Tokyo, JP;

Hideo Shimizu, Tokyo, JP;

Yuichi Komano, Kanagawa, JP;

Hanae Ikeda, Tokyo, JP;

Atsushi Shimbo, Tokyo, JP;

Inventors:

Tsukasa Endo, Tokyo, JP;

Hideo Shimizu, Tokyo, JP;

Yuichi Komano, Kanagawa, JP;

Hanae Ikeda, Tokyo, JP;

Atsushi Shimbo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, in an encryption device, a segmentation unit segments masked plain data into pieces of first segmented data. A first processing unit generates pieces of second segmented data from the pieces of first segmented data. A nonlinear transform unit generates pieces of third segmented data transformed from the pieces of second segmented data. A data integration unit integrates fourth segmented data to generate masked encrypted data. An unmask processing unit generates encrypted data from the masked encrypted data. The exclusive OR of the pieces of second segmented data matches the exclusive OR of input data, subjected to nonlinear transform processing and calculated from the plain data, and the first mask. The exclusive OR of the pieces of third segmented data matches the exclusive OR of transform data, obtained when the nonlinear transform processing is performed on the input data, and the second mask.


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