The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Sep. 02, 2010
Valentin Korman, Huntsville, AL (US);
Kevin W. Pedersen, Huntsville, AL (US);
William K. Witherow, Huntsville, AL (US);
Valentin Korman, Huntsville, AL (US);
Kevin W. Pedersen, Huntsville, AL (US);
William K. Witherow, Huntsville, AL (US);
Abstract
The present invention is a mass gauging interferometry system used to determine the volume contained within a tank. By using an optical interferometric technique to determine gas density and/or pressure a much smaller compression volume or higher fidelity measurement is possible. The mass gauging interferometer system is comprised of an optical source, a component that splits the optical source into a plurality of beams, a component that recombines the split beams, an optical cell operatively coupled to a tank, a detector for detecting fringes, and a means for compression. A portion of the beam travels through the optical cell operatively coupled to the tank, while the other beam(s) is a reference.