The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Mar. 02, 2009
H. Daniel Ou-yang, Bethlehem, PA (US);
Xuanhong Cheng, Bethlehem, PA (US);
H. Daniel Ou-Yang, Bethlehem, PA (US);
Xuanhong Cheng, Bethlehem, PA (US);
Lehigh University, Bethlehem, PA (US);
Abstract
Provided herein are new methods and apparatus for quantitative measurement and analysis of particles, including new apparatus systems to process and detect nanoparticles in suspension. By focusing a laser beam at the center of a reservoir, nanoparticles are concentrated by optical energy, and fluorescent intensity at the focal point of the laser is measured to quantify particle concentration in the reservoir. The techniques may be applied to the analysis of suspensions of nanoparticles, including natural particles (e.g., microorganisms including whole viruses, bacteria, animal cells, and proteins) and synthetic particles (e.g., colloidal latexes, paints, pigments, and metallic or semiconductor nanoparticles) for medical and industrial applications, among others.