The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

Feb. 11, 2011
Applicants:

John Maier, Pittsburgh, PA (US);

Michael Fuhrman, Pittsburgh, PA (US);

Inventors:

John Maier, Pittsburgh, PA (US);

Michael Fuhrman, Pittsburgh, PA (US);

Assignee:

ChemImage Technologies, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for providing an instrument response correction. A sample is illuminated to generate a first plurality and a second plurality of interacted photons. The first plurality of interacted photons may be detected by a dispersive spectrometer to generate a reference spectrum representative of the sample. The second plurality of interacted photons may be passed through a tunable filter and detected using an imaging detector to generate at least one hyperspectral image. This hyperspectral image may comprise a Raman hyperspectral image or an infrared hyperspectral image. A system may comprise an illumination source, a collection optics, a dispersive spectrometer, a fiber optic, a tunable filter, and an imaging detector.


Find Patent Forward Citations

Loading…