The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
May. 02, 2012
Kenichi Tajika, Osaka, JP;
Hiroshi Shirouzu, Shiga, JP;
Kenichi Tajika, Osaka, JP;
Hiroshi Shirouzu, Shiga, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An inspection method for an active-matrix substrate including the scanning lines, the data lines, the pixels disposed in matrix, and the power lines. The pixel includes: an organic EL device; a drive transistor; a capacitor; a selection transistor having a gate connected to the scanning line and connected between the data line and the gate of the drive transistor, and the guard potential transistor having a gate connected to a source of the selection transistor, a source connected to a drain of the selection transistor, and a drain connected to the power line. The inspection method includes: a writing process for writing a charge in the capacitor; a reading process for reading the written charged from the capacitor; and a holding process for holding the charge for a predetermined period from the end of the writing process to the start of the reading process.