The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Mar. 28, 2008
Kenjiro Kimura, Kyoto, JP;
Kei Kobayashi, Kyoto, JP;
Hirofumi Yamada, Kyoto, JP;
Kazumi Matsushige, Kyoto, JP;
Takashi Horiuchi, Kyoto, JP;
Nobuo Satoh, Kyoto, JP;
Akifumi Nakai, Kyoto, JP;
Kenjiro Kimura, Kyoto, JP;
Kei Kobayashi, Kyoto, JP;
Hirofumi Yamada, Kyoto, JP;
Kazumi Matsushige, Kyoto, JP;
Takashi Horiuchi, Kyoto, JP;
Nobuo Satoh, Kyoto, JP;
Akifumi Nakai, Kyoto, JP;
Kyoto University, Kyoto, JP;
Abstract
Above a sample () having magnetic domains, a distribution of magnetic force in a measurement plane () is obtained as a magnetic force image using a MFM, an auxiliary magnetic force image is obtained by performing measurement in a measurement plane () away from the measurement plane () by a distance d, and a difference between them is divided by the distance d to obtain a magnetic force gradient image. The magnetic force image and the auxiliary magnetic force image are Fourier transformed and substituted into a three-dimensional field obtaining equation derived from a general solution of the Laplace equation, and the three-dimensional field indicating the magnetic force is obtained. A state of the magnetic domains at the surface () of the sample () can be obtained with high accuracy by obtaining the three-dimensional field.