The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Jul. 30, 2010
Thomas Geoffrey Ronald Beynon, Dronfield, GB;
Ian Hamilton Ridley, Sheffield, GB;
Stuart Francis Metcalfe, Sheffield, GB;
Andrew Mellor, Rotherham, GB;
Ben Wileman, Rotherham, GB;
Thomas Geoffrey Ronald Beynon, Dronfield, GB;
Ian Hamilton Ridley, Sheffield, GB;
Stuart Francis Metcalfe, Sheffield, GB;
Andrew Mellor, Rotherham, GB;
Ben Wileman, Rotherham, GB;
Land Instruments International Limited, Leicestershire, GB;
Abstract
A method of measuring the temperature of a sheet material in which the sheet material is arranged such that it forms at least one side of a cavity so as to enhance the effective emissivity of the sheet material in the vicinity of the cavity. The method involves a) generating a thermal image of at least part of the inside of the cavity using a thermal imaging device to detect radiation emitted by the cavity, the thermal image comprising a plurality of pixels each having a pixel value representative of radiation emitted by a respective region of the cavity; b) identifying a first subset of the plurality of pixels whose pixel values meet predetermined criteria; c) using the identified first subset of pixels to determine a line on the thermal image representative of optimal emissivity enhancement in the cavity; and d) selecting a second subset of the plurality of pixels based on the determined line and generating a temperature profile along the determined line derived from the pixel values associated with each of the second subset of pixels.