The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2013

Filed:

May. 11, 2010
Applicants:

Satoshi Miyamoto, Yamatokoriyama, JP;

Ryuichi Fujiwara, Yamatokoriyama, JP;

Shizuo Nishikawa, Yamatokoriyama, JP;

Hisayoshi Morita, Yamatokoriyama, JP;

Inventors:

Satoshi Miyamoto, Yamatokoriyama, JP;

Ryuichi Fujiwara, Yamatokoriyama, JP;

Shizuo Nishikawa, Yamatokoriyama, JP;

Hisayoshi Morita, Yamatokoriyama, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23B 3/06 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a machining system etc. capable of highly accurately machining a workpiece even in a case where the workpiece is deflected. A machining systemis configured with a lathehaving end portion supporting mechanismsfor supporting both end portions of an elongated workpiece W horizontally, a tool restfor holding a tool, a feed mechanism for moving the tool restin three orthogonal directions, and a control devicefor controlling the feed mechanism, and a non-contact measuring devicefor measuring the deflection shape of the workpiece W when the workpiece W is rotated. The control devicemoves the tool along the deflection shape measured by the non-contact measuring device


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