The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2013
Filed:
Oct. 17, 2011
Kozue Tomiyama, Hino, JP;
Toru Terabayashi, Sagamihara, JP;
Hideyuki Kamei, Yokohama, JP;
Takenori Motoki, Yokohama, JP;
Tetsuya Tanaka, Yokohama, JP;
Martine Hori, Sagamihara, JP;
Kozue Tomiyama, Hino, JP;
Toru Terabayashi, Sagamihara, JP;
Hideyuki Kamei, Yokohama, JP;
Takenori Motoki, Yokohama, JP;
Tetsuya Tanaka, Yokohama, JP;
Martine Hori, Sagamihara, JP;
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
Systems and methods of determining parameter values in a downhole environment are described. An example method of determining a parameter value using calibration information is described. The calibration information corresponding to different parameter ranges in a downhole environment. The method includes determining a parameter range in the downhole environment using a controller and obtaining first calibration information or second calibration information based on the parameter range. The first calibration information associated with a first parameter range and the second calibration information associated with a second parameter range. The method also includes receiving an output signal from a sensor associated with the parameter and using the obtained calibration information to determine the parameter value based on the output signal received.