The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Sep. 19, 2007
Applicants:

Yuanyuan Zhou, Champaign, IL (US);

Shan LU, Urbana, IL (US);

Joseph Andrew Tucek, Champaign, IL (US);

Inventors:

Yuanyuan Zhou, Champaign, IL (US);

Shan Lu, Urbana, IL (US);

Joseph Andrew Tucek, Champaign, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

During execution of a program, the situation where the atomicity of a pair of instructions that are to be executed atomically is violated is identified, and a bug is detected as occurring in the program at the pair of instructions. The pairs of instructions that are to be executed atomically can be identified in different manners, such as by executing a program multiple times and using the results of those executions to automatically identify the pairs of instructions.


Find Patent Forward Citations

Zhou, Yuanyuan. (2013). Atomicity violation detection using access interleaving invariants (U.S. Patent No. 8533681). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8533681

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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