The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Feb. 28, 2011
Jianjun Xu, Petaluma, CA (US);
Jason M. Horn, Santa Rosa, CA (US);
Masaya Iwamoto, Rohnert Park, CA (US);
David E. Root, Santa Rosa, CA (US);
Jianjun Xu, Petaluma, CA (US);
Jason M. Horn, Santa Rosa, CA (US);
Masaya Iwamoto, Rohnert Park, CA (US);
David E. Root, Santa Rosa, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and system are provided for generating a nonlinear simulation model of a device under test (DUT). The method and system include receiving large-signal nonlinear waveform data based on responses of the DUT to input signals, determining a set of first dynamical variables and a set of second dynamical variables from the nonlinear waveform data, calculating values of second dynamical variables, providing nonlinear constitutive relations as functions of the first dynamical variables and the calculated values of the second dynamical variables, and compiling the nonlinear simulation model of the DUT using the identified nonlinear constitutive relations.