The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Dec. 23, 2009
Applicants:

Yajun-edwin Zhang, Shanghai, CN;

Zhao Xia Jin, Shanghai, CN;

Jerry Qi Huang, Markham, CA;

Andrew D. Halford, Manchester, MD (US);

Chengyi Liu, Shanghai, CN;

Curtis Mitchell, Newmarket, CA;

Inventors:

Yajun-Edwin Zhang, Shanghai, CN;

Zhao Xia Jin, Shanghai, CN;

Jerry Qi Huang, Markham, CA;

Andrew D. Halford, Manchester, MD (US);

Chengyi Liu, Shanghai, CN;

Curtis Mitchell, Newmarket, CA;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G09B 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system which may enable users to plan, design and observe various building systems in an abstract and intuitive view, such as with a map view. In this view, virtually all facility information and objects may be displayed as simple shapes (e.g., rectangles). Just by some drag-and-drop, a user may provide shapes and rearrange positions of these shapes quickly to reflect a desired space relationship. Objects (e.g., components, devices, controllers, and the like) may be placed, moved around, and associated with each other on a facility layer or floor. Further, the map view may be used together with a tree view and a list view to provide alternative design ways. Changes made in any of the views may be synchronized with the other views. Various presentations of the facility may be provided.


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