The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Feb. 18, 2010
Fei Yan, State College, PA (US);
Joseph L. Rose, State College, PA (US);
Fei Yan, State College, PA (US);
Joseph L. Rose, State College, PA (US);
FBS, Inc., State College, PA (US);
Abstract
An inspection method includes driving a plurality of spaced apart transmitting transducer elements with a respective time delay and a respective frequency such that each of the transmitting transducer elements transmits an ultrasonic guided wave through a transmission medium defined by a material having at least one unknown physical property. The ultrasonic guided waves are received at a receiving transducer element disposed at a distance from the transmitting transducer elements. A respective time delay and a respective frequency for each of the transmitting transducer elements is determined that provides a maximum amplitude in a signal received at the receiving transducer element. The plurality of transmitting transducer elements are activated in accordance with the determined time delays and frequencies to transmit inspection signals through the transmission medium. A location of a defect in the material is determined based on velocities of the inspection signals received at the receiving transducer element.