The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Jul. 07, 2009
Kazuhiro Ichikawa, Fukuoka, JP;
Hideo Utsumi, Fukuoka, JP;
Kazuhiro Ichikawa, Fukuoka, JP;
Hideo Utsumi, Fukuoka, JP;
Kyushi University, Fukuoka, JP;
Abstract
A measurement device and measurement method make it possible to eliminate the load generated by stopping on a measurement subject that is moved among multiple magnetic field generating devices. The measurement device includes a first external magnetic field generating device that generates a magnetic field of a set size, a second external magnetic field generating device that generates a magnetic field of a size that differs from that of the magnetic field of the first external magnetic field generating device, a rotating table that causes the subject of measurement to pass in sequence through the magnetic fields of the first and second external magnetic field generating devices by causing the subject of measurement to move rotationally, and an OMRI measurement processing part and MRI measurement processing part that measures images such as functional images or structural images of the subject of measurement while it is being moved rotationally by the rotating table.