The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Dec. 03, 2012
Ecole DE Technologie Superieure, Montreal, CA;
Soroosh Rezazadeh, Montreal, CA;
Stéphane Coulombe, Brossard, CA;
Ecole de Technologie Superieure, Montreal, CA;
Abstract
Method and system for low complexity assessment of quality of an image are presented. By performing multiresolution decomposition of images using, for example, a discrete wavelet transform, and determining a metric based on a structural similarity index or a structural similarity map, a structural similarity score, characterizing similarity between images with a high degree of accuracy, is produced. The processing time is much smaller in comparison to that required by other methods producing image quality metrics of comparable accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile