The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Apr. 17, 2009
Applicants:

Daniel Shedlock, Oak Ridge, TN (US);

Christopher Meng, Gainesville, FL (US);

Nissia Sabri, Gainesville, FL (US);

Edward T. Dugan, Gainesville, FL (US);

Sharon Auerbach Jacobs, Gainesville, FL (US);

Inventors:

Daniel Shedlock, Oak Ridge, TN (US);

Christopher Meng, Gainesville, FL (US);

Nissia Sabri, Gainesville, FL (US);

Edward T. Dugan, Gainesville, FL (US);

Alan M. Jacobs, Gainesville, FL (US);

Assignees:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Nucsafe, inc., Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods of x-ray backscatter radiography are provided. A single-sided, non-destructive imaging technique utilizing x-ray radiation to image subsurface features is disclosed, capable of scanning a region using a fan beam aperture and gathering data using rotational motion.


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