The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Nov. 29, 2010
Applicants:
Taihei Mukaide, Atsugi, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Kazuhiro Takada, Kawasaki, JP;
Takashi Noma, Hadano, JP;
Inventors:
Taihei Mukaide, Atsugi, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Kazuhiro Takada, Kawasaki, JP;
Takashi Noma, Hadano, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray imaging apparatus and an X-ray imaging method can alleviate the influence of scattered X-rays relative to the obtained image. A differential phase contrast image or a phase contrast image of a detection object is computed by using a splitting element and an exposure control unit that synchronizes the X-ray scanning speed and the image acquisition speed of a detecting unit.