The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Jul. 26, 2010
Kaushik Ghosh, San Diego, CA (US);
Kaushik Ghosh, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Distribution parameter mapping determines the bit error probability (BEP) of a burst transmitted from a base station to the mobile station using a modulation and coding scheme (MCS) specified in the EDGE standard. Depending on whether the multi-bit soft decisions of the burst most resemble a Gaussian or a Rician distribution, the statistical parameters μ and σ or A and u are determined. The ratio μ/σ or A/σ is mapped to an empirically determined BEP in a Gaussian or Rician lookup table, respectively. The BEPs are not influenced by the degree of code redundancy in the MCS. The BEPs for the four bursts in a radio block are then averaged, filtered and quantized according to the EDGE standard. The quantization level of the average BEP is reported to the base station so that subsequent radio blocks can be transmitted using an MCS that is appropriate for the estimated BEP.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile