The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Jan. 15, 2009
Akio Minakuchi, Okazaki, JP;
Akio Minakuchi, Okazaki, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;
Abstract
A method for inspecting the width of a coated film in accordance with the present disclosure is a method for detecting a width Wof a coated film, the method including: a step of measuring a thickness profile in the transverse direction of the coated film; a step of creating approximating curves L, Lof a function of a distance X and a thickness Y in end-proximal regionsof both ends of the coated film; and a step of taking a distance Xcorresponding to a thickness threshold Ydetermined from the approximating curve Lof one end-proximal regionand a distance Xcorresponding to the thickness threshold Ydetermined from the approximating curve Lof the other end-proximal region, and of calculating X−Xas the width W