The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Sep. 15, 2011
Applicants:

Justin W. Klein, Blacksburg, VA (US);

Mark E. Froggatt, Blacksburg, VA (US);

Stephen T. Kreger, Blacksburg, VA (US);

Dawn K. Gifford, Blacksburg, VA (US);

Sandra M. Klute, Blacksburg, VA (US);

Inventors:

Justin W. Klein, Blacksburg, VA (US);

Mark E. Froggatt, Blacksburg, VA (US);

Stephen T. Kreger, Blacksburg, VA (US);

Dawn K. Gifford, Blacksburg, VA (US);

Sandra M. Klute, Blacksburg, VA (US);

Assignee:

Luna Innovations Incorporated, Roanoke, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An interferometric measurement system includes a spun optical fiber including multiple optical waveguides configured in the fiber. Interferometric detection circuitry detects measurement interferometric pattern data associated with each of the multiple optical waveguides when the optical fiber is placed into a bend. Data processing circuitry determines compensation parameters that compensate for variations between an optimal configuration of the multiple optical waveguides in the fiber and an actual configuration of multiple optical waveguides in the fiber. The compensation parameters are stored in memory for compensating subsequently-obtained measurement interferometric pattern data for the fiber. The compensation parameters are applied to the subsequently-obtained measurement interferometric pattern data in order to distinguish between axial strain, bend strain, and twist strain on the fiber and to accurately determine one or more strain values for the fiber corresponding to one or more of the axial strain, bend strain, or twist strain on the fiber.


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