The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Jun. 09, 2005
Michael Mahler, Leinfelden-Echterdingen, DE;
Ulli Hoffmann, Nieffern-Oeschelbronn, DE;
Reiner Krapf, Reutlingen, DE;
Christoph Wieland, Herrenberg-Kuppingen, DE;
Felix Wewers, Leverkusen, DE;
Michael Mahler, Leinfelden-Echterdingen, DE;
Ulli Hoffmann, Nieffern-Oeschelbronn, DE;
Reiner Krapf, Reutlingen, DE;
Christoph Wieland, Herrenberg-Kuppingen, DE;
Felix Wewers, Leverkusen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal () in the gigahertz frequency range emitted using a high-frequency transmitter () penetrates the material () to be investigated at least once and is detected by a high-frequency receiver (). According to the present invention, it is provided that the thickness (d) of the material () is measured via at least two transit-time measurements of the measurement signal () performed at various positions () of the high-frequency transmitter () and/or the high-frequency receiver (). The present invention also relates to a device system () for carrying out the method described above.