The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8531200 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 10, 2013

Filed:

Jul. 07, 2010
Applicant:

Sun-suk Yang, Gyeonggi-do, KR;

Inventor:

Sun-Suk Yang, Gyeonggi-do, KR;

Assignee:

Hynix Semiconductor Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes an internal operation signal generation circuit configured to generate an internal operation signal in response to a signal applied through a reset signal input pad during a test period.


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Yang, Sun-Suk. (2013). Semiconductor device for performing test operation and method thereof (U.S. Patent No. 8531200). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8531200

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