The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Sep. 07, 2011
Applicants:

Daniel Hawel, Detmold, DE;

Andre Korrek, Marienmünster, DE;

Elmar Schaper, Lügde, DE;

Stephan Hansmeier, Bad Salzuflen, DE;

Lutz Heuer, Blomberg, DE;

Bernd Schulz, Steinheim, DE;

Inventors:

Daniel Hawel, Detmold, DE;

Andre Korrek, Marienmünster, DE;

Elmar Schaper, Lügde, DE;

Stephan Hansmeier, Bad Salzuflen, DE;

Lutz Heuer, Blomberg, DE;

Bernd Schulz, Steinheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device () for the detection of current asymmetries in three-phase circuits (L, L, L) is provided. This device () has a first current measuring mechanism (S) for the measurement of first phase (L) and a second current measuring mechanism (S) for the measurement of a second phase (L). Furthermore, the device has a computing unit (ALU) which determines a current symmetry value (N; N) of the third phase (L) relative to the first phase (L) or second phase (L) from the measured first phase and from the measured second phase. Moreover, an associated method is also provided.


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