The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Feb. 18, 2010
Applicant:

Johannes Fieres, Heidelberg, DE;

Inventor:

Johannes Fieres, Heidelberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for determining control parameters for a particle irradiation system that deposits different dose values at different target points in a target volume through the selection of sampling points by a particle beam is provided. The device includes an input for receiving information relating to a predefined dose distribution via target points, and a determination component for determining a particle number distribution that is to be deposited during the irradiation via sampling points. The determining takes place using the predefined dose distribution and a variable, which takes into account differences in the particle number distribution between particle numbers of different sampling points.


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Fieres, Johannes. (2013). Optimization of control parameters for a particle irradiation system (U.S. Patent No. 8530864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8530864

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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