The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Jun. 06, 2011
Applicants:
Yuya Miyazono, Tokyo, JP;
Daisuke Nishiwaki, Tokyo, JP;
Shinichi Hayashi, Tokyo, JP;
Inventors:
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning microscope is provided with a scan unit that scans a sample, the scanning microscope including: a transmissive VPH grating for dispersing light from the sample; and a photodetector for detecting the light diffracted by the VPH grating.