The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Dec. 01, 2010
Applicant:

Kenji Nakamura, Aichi, JP;

Inventor:

Kenji Nakamura, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eye refractive power measurement apparatus includes a measurement optical system, a calculator and an output unit. The measurement optical system projects measurement light onto a fundus of an examinee's eye, extracts the measurement light reflected on the fundus as ring-shaped light, and causes an imaging device to capture a ring-shaped image. The calculator measures eye refractive power of the examinee's eye, based on the ring-shaped image captured by the imaging device, specifies a position of the ring-shaped image to calculate a measured line of the image, performs approximate processing on the measured line to calculate an approximate curve, and calculates a displacement between the measured line and the approximate curve in a meridian direction for each divided region. The output unit outputs a measurement result of the eye refractive power and a calculation result of the displacement in each divided region.


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