The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
Nov. 03, 2010
Fumihiro Goto, Kawasaki, JP;
Akitoshi Yamada, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Fumitaka Goto, Tokyo, JP;
Okinori Tsuchiya, Yokohama, JP;
Takashi Fujita, Kawasaki, JP;
Rie Kajihara, Minoo, JP;
Ayumi Sano, Kawasaki, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Fumihiro Goto, Kawasaki, JP;
Akitoshi Yamada, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Fumitaka Goto, Tokyo, JP;
Okinori Tsuchiya, Yokohama, JP;
Takashi Fujita, Kawasaki, JP;
Rie Kajihara, Minoo, JP;
Ayumi Sano, Kawasaki, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided are an image processor and an image processing method that are capable of suppressing both density unevenness due to printing position shifts among a group of dots printed by a plurality of relative movements (or a plurality of printing element groups) and graininess. In order to accomplish this, a dot overlap rate in the printing mode in which the density unevenness stands out is made higher than the dot overlap rate in the printing mode in which other defects stand out more than the density unevenness. By doing so, it is possible to suitably adjust the dot overlap rate according to the image characteristic, and output an image having no density unevenness or graininess.