The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Sep. 17, 2009
Nobuhiro Hosokawa, Tokyo, JP;
Yuka Mori, Tokyo, JP;
Miwako Naoi, Tokyo, JP;
Kazutaka Yamasaki, Tokyo, JP;
Nobuhiro Hosokawa, Tokyo, JP;
Yuka Mori, Tokyo, JP;
Miwako Naoi, Tokyo, JP;
Kazutaka Yamasaki, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A source code inspection method and system. The method includes receiving by a computing system, source code files associated with a specified project. The computing system retrieves metrics data comprising software metrics associated with the source code files. The computing system generates first evaluation scores associated with the source code files. The computing system generates and presents to a user, a graph displaying the first evaluation scores. The computing system calculates parameter values associated with an evaluation function used to calculate second evaluation scores associated with the source code files. The computing system calculates the second evaluation scores by enabling the evaluation function using the parameter values. The computing system generates and presents to the user, a second graph displaying the second evaluation scores.