The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Jun. 04, 2007
Alain G. Moriat, Copenhagen, DK;
Patrick J. Christmas, Boulder, CO (US);
Alain G. Moriat, Copenhagen, DK;
Patrick J. Christmas, Boulder, CO (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for creating a measurement application. User input specifying a sequence of functions implementing a measurement application is received, where the sequence of functions are executable to perform a specified task utilizing one or more hardware devices, and where the user input further specifies the hardware devices. Configuration of the measurement application is automatically analyzed according to rules specifying operation of the sequence of functions and the hardware devices. One or more errors in the measurement application are automatically determined based on the analyzing, and error information regarding the errors is displayed on a computer display, where the error information is usable to modify the measurement application to correct the one or more errors. In response to the error information, user input modifying the measurement application to correct the one or more errors may be received and/or the measurement application may be automatically modified to correct the errors.