The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8527952 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 03, 2013

Filed:

Aug. 25, 2009
Applicants:

Chun Guang Zeng, Beijing, CN;

Zhi Zhang, Beijing, CN;

Inventors:

Chun Guang Zeng, Beijing, CN;

Zhi Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test coverage analysis method and corresponding apparatus are disclosed, wherein, by executing the program under test using one or more test cases, generating one or more heapdump files containing the call stack information of the program under test, and analyzing the call stack information in the one or more heapdump files, the coverage information of the one or more test cases in terms of functions in the program under test is obtained.


Find Patent Forward Citations

Zeng, Chun. (2013). Test coverage analysis method and apparatus (U.S. Patent No. 8527952). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8527952

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